IDDQ Measurement Based Diagnosis of Bridging Faults in Full Scan Circuits
نویسندگان
چکیده
An algorithm for diagnosing two node bridging faults in static CMOS combinational circuits(full scan circuits) is presented. This algorithm uses results from I DDQ testing. The bridging faults considered can be between nodes that are outputs of a gate or internal nodes of a gates. Experimental results on all the ISCAS89 circuits show that I DDQ measurement based diagnosis using a small number of randomly generated vectors, is very eeective. Moreover, it is computationally feasible to diagnose such a large number of bridging faults when I DDQ measurement is used.
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